CEMS 215: Microscopy and Microstructural Characterization

Department
Credits 3
This course introduces optical; electron; and scanning probe microscopy techniques used to characterize the microstructure of materials. Lectures focus on the fundamental physical/chemical phenomena associated with the various techniques; their practical application; and the interpretation of the resultant data. Capabilities and limitations of these techniques are discussed. Laboratory exercises consist of the preparation and hands-on characterization of a variety of materials via both optical and electron microscope techniques.
Prerequisites
Prerequisites: CEMS 214 and PHYS 126
Corequisites